Research/Patents/US 4990762
US 4990762Tier 3 — General Defense

LASER BEAM PHASE MEASUREMENT AND CONTROL SYSTEM

Assignee

US Government

Filed as: UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY

Filed

Dec 21, 1981

Granted

Feb 5, 1991

Location

SILVER SPRING MD US

Abstract

An intensity measurement system portion of a phase measurement and controlystem permits rapid measurement of the laser field intensity profile in the transverse plane of a main laser beam. The intensity measurement system portion measures the laser field intensity profile by measuring the intensities of a plurality of beam samples of the main laser beam. The aforementioned measured intensities are processed in a phase computer according to a predetermined algorithm to generate drive current profiles in response to the phase variations of the main laser beam. These drive currents a dither-control amplifier which causes electromechanical movement of a plurality of mirror segments of a multi-dither mirror to correct for the random phase variations in the main laser beam. An important consideration in configuring the intensity measurement system portion of the present invention is the use of a reflecting stop and a reflecting stop detector combination to obstruct one of the plurality of beam samples and to measure the intensity thereof at the reflecting stop position.

Source: Google Patents

35 USC §181 Secrecy Order

Imposed

Oct 5, 1983

Rescinded

Sep 20, 1990

Duration

6 years, 11 months

Inventor

  • 1LEONARD S. TAYLOR

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Back to patent indexSource: USPTO 35 USC §181 secrecy order records