Research/Patents/US 5437190
US 5437190Tier 3 — General Defense

METHOD FOR DETERMINING THE EFFECTS OF STRESS

Assignee

US Government

Filed as: UNITED STATES OF AMERICA, THE, AS REPRESENTED BY THE SECRETARY OF THE NAVY

Filed

May 29, 1991

Granted

Aug 1, 1995

Location

Arlington VA (defense contractors)

Abstract

A method of determining the effects of stress on a non-linear orthotropic ssile structure. Measurements of non-linear orthotropic strain, due to step-wise increasing stress in one of three orthogonal directions, are made. Non-linear orthotropic strain terms of the missile structure, in each of three orthogonal directions, are determined from the measurements. A compliance matrix is formed by using the determined strain terms. This compliance matrix is used in an iterative fashion of step-wise increasing stress, to determine three dimensional strain of the missile structure.

Source: Google Patents

35 USC §181 Secrecy Order

Imposed

Nov 12, 1991

Rescinded

Feb 28, 1995

Duration

3 years, 3 months

Inventor

  • 1DAVID B. EHRENPREIS

Sensitive facility: Arlington VA (defense contractors)

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Back to patent indexSource: USPTO 35 USC §181 secrecy order records