US 5293211
MICROREFLECTOMETER SYSTEM
Assignee
UNITED STATES OF AMERICA AS REPRESENTED BY THE SECREARY OF THE AIR FORCE
Filed
Oct 6, 1983
Granted
Mar 8, 1994
Location
Arlington VA (defense contractors)
Abstract
The microreflectometer system, forming a 0.01 mm2 area spot, scans a mirror coating for defects of a mirror having a diameter of about 30 centimeters. Tens of thousands of reflectivity measurements are automatically taken as a computer controlled three dimension stage having the test mirror therein is selectively controlled. The reflectivity of each measurement either relative or absolute is used to determine the condition of the coating.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Apr 2, 1985
Rescinded
Jul 29, 1992
Duration
7 years, 4 months
Inventor
- 1JAY M. BERNARD
Sensitive facility: Arlington VA (defense contractors)
Record Details
- Patent number
- US 5293211
- Application
- 06543657
- Aerospace match
- No
- Dataset source
- 35 USC §181 SO records
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UNITED STATES OF AMERICA AS REPRESENTED BY THE SECREARY OF THE AIR FORCEBack to patent indexSource: USPTO 35 USC §181 secrecy order records