Research/Patents/US 5264699
US 5264699

INFRARED DETECTOR HYBRID ARRAY WITH IMPROVED THERMAL CYCLE RELIABILITY AND METHOD FOR MAKING SAME

Assignee

AMBER ENGINEERING, INC., A CORP OF CA

Filed

Feb 20, 1991

Granted

Nov 23, 1993

Location

GOLETA CA US

Abstract

A hybrid infrared focal plane array detector employs a thinned detector layer and substrate directly bonded to a conventional semiconductor readout integrated circuit substrate. The infrared detector layer and transparent substrate is thinned to a thickness of approximately 25-400μ to allow the detector to act like a flexible membrane to elastically respond to thermal mismatch due to differing coefficients of thermal expansion between the detector and semiconductor readout circuit as the hybrid device is cooled from manufacturing at room temperature to cryogenic operation temperatures. By thinning the detector substrate to a desired thickness, essentially unlimited hybrid detector sizes may be obtained. Additionally, the detector layer and substrate may be divided into sub-arrays to provide further resistance to stress induced from thermal mismatch.

Source: Google Patents

35 USC §181 Secrecy Order

Imposed

Jun 24, 1991

Rescinded

Sep 14, 1992

Duration

1 year, 2 months

Inventor

  • 1JEFFREY BARTON

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Back to patent indexSource: USPTO 35 USC §181 secrecy order records