INFRARED DETECTOR HYBRID ARRAY WITH IMPROVED THERMAL CYCLE RELIABILITY AND METHOD FOR MAKING SAME
Assignee
AMBER ENGINEERING, INC., A CORP OF CA
Filed
Feb 20, 1991
Granted
Nov 23, 1993
Location
GOLETA CA US
Abstract
A hybrid infrared focal plane array detector employs a thinned detector layer and substrate directly bonded to a conventional semiconductor readout integrated circuit substrate. The infrared detector layer and transparent substrate is thinned to a thickness of approximately 25-400μ to allow the detector to act like a flexible membrane to elastically respond to thermal mismatch due to differing coefficients of thermal expansion between the detector and semiconductor readout circuit as the hybrid device is cooled from manufacturing at room temperature to cryogenic operation temperatures. By thinning the detector substrate to a desired thickness, essentially unlimited hybrid detector sizes may be obtained. Additionally, the detector layer and substrate may be divided into sub-arrays to provide further resistance to stress induced from thermal mismatch.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Jun 24, 1991
Rescinded
Sep 14, 1992
Duration
1 year, 2 months
Inventor
- 1JEFFREY BARTON
Record Details
- Patent number
- US 5264699
- Application
- 07658985
- Aerospace match
- Yes
- Dataset source
- 35 USC §181 SO records
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