MIRROR FOR INFRARED AND VISIBLE WAVELENGTH RADIATION
Assignee
Hughes Aircraft
Filed as: HUGHES AIRCRAFT COMPANY
Filed
May 3, 1982
Granted
Oct 26, 1993
Location
WOODLAND HILLS CA US
Abstract
High reflectance mirror 40 for multiple wavelengths has substrate 42 which carries first reflector stack 46 for reflection of the principal, longer wavelength and a stack 66 which reflects shorter wavelength in an alignment beam. Semiconductor layer 64 separates passes the longer wavelength but reflects and/or absorbs the alignment beam of shorter wavelength. Layer 64 thus effectively optically decouples stacks 46 and 66. Each of the layers in the longer wave first reflecting stack 46 is of an optical thickness equal to an odd number of quarter wavelengths of the principal beam. The semiconductor layer 64 and the shorter wavelength reflecting an optical thickness equal to an even number of quarter wavelengths of the principal beam.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Dec 29, 1982
Rescinded
Jul 7, 1992
Duration
9 years, 6 months
Inventor
- 1JAMES E. ROGERS
Technology Domains
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Record Details
- Patent number
- US 5257140
- Application
- 00637422
- Aerospace match
- Yes
- Dataset source
- 35 USC §181 SO records
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