US 4998071
NOISE PARAMETER TEST METHOD AND APPARATUS
Assignee
CASCADE MICROTECH, INC., AN OREGON CORP.
Filed
Oct 25, 1988
Granted
Mar 5, 1991
Location
PORTLAND OR US
Abstract
Method and apparatus for simultaneously measuring noise power of a two-port device under test (DUT) using a one-port tuner, a low-noise amplifier, a power divider with a plurality of outputs, and a plurality of noise meters. The noise meters are configured to measure available noise power in different frequency ranges which are closely spaced around a selected central frequency, thereby yielding the noise parameters of the DUT at the central frequency.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Apr 12, 1989
Rescinded
Jul 31, 1989
Duration
3 months
Inventor
- 1ERIC W. STRID
Record Details
- Patent number
- US 4998071
- Application
- 07262463
- Aerospace match
- No
- Dataset source
- 35 USC §181 SO records
Browse by Assignee
CASCADE MICROTECH, INC., AN OREGON CORP.Back to patent indexSource: USPTO 35 USC §181 secrecy order records