METHOD OF MEASURING THE THERMAL HYSTERESIS OF QUARTZ CRYSTAL RESONATORS
Assignee
US Government
Filed as: UNITED STATES OF AMERICA, THE, AS REPRESENTED BY THE SECRETARY OF THE ARMY
Filed
Aug 29, 1988
Granted
Apr 17, 1990
Location
LEBANON NJ US
Abstract
The thermal hysteresis of quartz crystal resonators is measured by exciting two modes of a quartz crystal of interest with an external frequency source at a preselected temperature, calculating the difference frequency as between the modes, resetting to the original set temperature after temporarily altering the temperature, remeasuring the frequencies while maintaining the temperature and the difference frequency at the same respective values as the original values, and taking the mode frequency difference as representative of the thermal hysteresis of the crystal.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Dec 22, 1988
Rescinded
May 5, 1989
Duration
4 months
Inventor
- 1RAYMOND L. FILLER
Record Details
- Patent number
- US 4918372
- Application
- 07246146
- Aerospace match
- No
- Dataset source
- 35 USC §181 SO records
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