Research/Patents/US 4717916
US 4717916

HIGH RESOLUTION IMAGING DOPPLER INTERFEROMETER

Assignee

HOLODYNE LTD., A CO PARTNERSHIP

Filed

May 16, 1986

Granted

Jan 5, 1988

Location

RICHMOND UT US

Abstract

A system for simultaneously locating a plurality of targets and distinguishing the targets from noise which utilizes phase detector techniques to generate complex voltage signals and obtain phase information. Spectral analysis is performed on the complex voltage temporal functions to generate doppler frequency functions. Both spectral phase functions and spectral amplitude functions are generated from the doppler frequency functions. Spectral phase functions are analyzed using interferometry techniques to determine if a potential target has a common locational source from returns of a plurality of sensors. A zenith angle is also generated using interferometry techniques to provide locational information of the multiple targets. Range gating and two frequency range detection methods provide high resolution range information as to the location of the targets. High resolution range information and two dimensional zenith angle information are used to provide an image of the targets. The present invention uses a two-frequency pulse which can be generated simultaneously or sequenced within a pulse in a manner which is phase coherent. The two-frequency pulse eliminates problems associated with range aliasing, zenith angle aliasing, scattering point analysis and allows for range location with high resolution. An error correction factor is also generated which eliminates spectral smearing.

Source: Google Patents

35 USC §181 Secrecy Order

Imposed

Apr 24, 1987

Rescinded

Jun 16, 1987

Duration

1 month

Inventor

  • 1GENE W. ADAMS

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Back to patent indexSource: USPTO 35 USC §181 secrecy order records