Research/Patents/US 4703266
US 4703266

GRADIENT METER WITH THIN MAGNETIC LAYER

Assignee

COMMISSARIAT A L'ENERGIE ATOMIQUE

Filed

Mar 2, 1981

Granted

Oct 27, 1987

Location

GIERES FR

Abstract

Gradient meter to measure the spatial derivatives ΔHi/Δj (i=x, y, z ; j=x, y, z) of a magnetic field. This gradient meter comprises two magnetic sonds (7a, 7b) with thin layer, of which the geometric axes of the counterreaction windings are aligned in the direction of axis i, said sonds being spaced from each other along the axis j, the counterreaction current of the first sond being injected in the second sond, the counterreaction current of said second sond being then representative of the value ΔHi/Δj to be measured.

Source: Google Patents

35 USC §181 Secrecy Order

Imposed

Sep 29, 1983

Rescinded

Dec 20, 1985

Duration

2 years, 2 months

Inventor

  • 1GUY CHIRON

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Back to patent indexSource: USPTO 35 USC §181 secrecy order records