APPARATUS FOR PRODUCING HIGH QUALITY EPTIAXIALLY GROWN SEMICONDUCTORS
Assignee
UNITED STATES OF AMERICA AS REPRESENTED BY THE SECREATRY OF THE ARMY
Filed
Dec 23, 1982
Granted
Oct 13, 1987
Location
WOODBRIDGE VA US
Abstract
A high pressure furnace and reusable demountable containment means for setive in situ information of epitaxial layers on a semiconductor substrate while under gas overpressure. The containment means has vent means therein for allowing the inert and reducing or reactive gases in an inner chamber of the furnace to enter into the interior of the containment means to equalize pressures on each side of the housing and to semi-confine the vapor from the epitaxial growth source materials in the interior of the containment means. The containment means has a removable, i.e. demountable, form-fittedly sealed plug which is removed to insert the substrate and growth source elements, which are mounted in a close-space relationship on a support structure, therein. The support structure is inserted back into the containment means and the plug is form fittedly sealed thereto for performing the epitaxial layering.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Jun 28, 1984
Rescinded
Sep 26, 1986
Duration
2 years, 3 months
Inventor
- 1HERBERT L. WILSON
Record Details
- Patent number
- US 4699084
- Application
- 06452673
- Aerospace match
- No
- Dataset source
- 35 USC §181 SO records