WEIGHTED RANDOM PATTERN TESTING APPARATUS AND METHOD
Assignee
INTERNATIONAL BUSINESS MACHINES CORPORATION, ARMONK, NY, A CORP. OF NEW YORK
Filed
Jun 24, 1985
Granted
Aug 18, 1987
Location
HOPEWELL JCT. NY US
Abstract
A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the output responses from each of the output terminals in parallel, combining these outputs to obtain a signature which is a predetermined function of all of the sequences of parallel outputs and comparing the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion as a function of the structure of the device to be tested, to individually weight the inputs in favor of more or less binary ones or zeros.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Feb 4, 1986
Rescinded
May 16, 1986
Duration
3 months
Inventor
- 1FRANCO MOTIKA
Record Details
- Patent number
- US 4688223
- Application
- 06748289
- Aerospace match
- Yes
- Dataset source
- 35 USC §181 SO records
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