Research/Patents/US 4688223
US 4688223

WEIGHTED RANDOM PATTERN TESTING APPARATUS AND METHOD

Assignee

INTERNATIONAL BUSINESS MACHINES CORPORATION, ARMONK, NY, A CORP. OF NEW YORK

Filed

Jun 24, 1985

Granted

Aug 18, 1987

Location

HOPEWELL JCT. NY US

Abstract

A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the output responses from each of the output terminals in parallel, combining these outputs to obtain a signature which is a predetermined function of all of the sequences of parallel outputs and comparing the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion as a function of the structure of the device to be tested, to individually weight the inputs in favor of more or less binary ones or zeros.

Source: Google Patents

35 USC §181 Secrecy Order

Imposed

Feb 4, 1986

Rescinded

May 16, 1986

Duration

3 months

Inventor

  • 1FRANCO MOTIKA

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Back to patent indexSource: USPTO 35 USC §181 secrecy order records