UNIVERSAL TEST BOARD, SERIAL INPUT (FOR SYNTHESIZER TESTING)

Abstract

An electronic system that processes or otherwise acts upon a serial data stream can be monitored at any one of several points to provide an indication that specific parts as well as the whole system are functioning properly. A selected digital address is dialed on a thumbwheel switch that provides a signal indicative of a particular time slot within a repetitive sequence of time slots and a counter produces a series of digital addresses that are representative of a repetitive sequence of time slots to enable a comparison and generation of a latch signal at the particular time slot indicated. A probe is placed in electrical engagement with that portion of the signal corresponding to the selected digital address and a series test input signal is drawn from the system. The serial test input signal is converted from serial form to parallel form and a digital to analog converter generates a representative analog output signal that may be compared with a standardized analog signal that should be present at the desired point in the system when all components are functioning properly. Various synchronizing and clock signal rates can be provided to give the test apparatus the capability for accommodating differently sized signals for generating in different test analog signals.

Source: Google Patents

35 USC §181 Secrecy Order

Inventor

• 1ROBERT E. PAGE

Sensitive facility: San Diego CA (SAIC/General Dynamics)