HEAT FLUX METER
Assignee
Lockheed/Skunk Works
Filed as: LOCKHEED CORPORATION
Filed
Apr 4, 1985
Granted
Mar 31, 1987
Location
Burbank CA (Lockheed)
Abstract
A heat flux meter determines the heat transfer characteristics prior to processing or during steady-state autoclave heating conditions utilizing a monitoring element selected-thereof such that lumped heat transfer analysis is applicable thereto. During the curing process of a material, the heat flux meter calculates the instantaneous convection film coefficient for a particular location and determines the total present heat flux to an object.
Source: Google Patents
35 USC §181 Secrecy Order
Imposed
Sep 10, 1985
Rescinded
Apr 23, 1986
Duration
7 months
Inventor
- 1MATT D PURSLEY
Sensitive facility: Burbank CA (Lockheed)
Record Details
- Patent number
- US 4653934
- Application
- 06720072
- Aerospace match
- No
- Dataset source
- 35 USC §181 SO records
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