Research/Patents/US 4653934
US 4653934Tier 1 — UAP Program Assignee

HEAT FLUX METER

Assignee

Lockheed/Skunk Works

Filed as: LOCKHEED CORPORATION

Filed

Apr 4, 1985

Granted

Mar 31, 1987

Location

Burbank CA (Lockheed)

Abstract

A heat flux meter determines the heat transfer characteristics prior to processing or during steady-state autoclave heating conditions utilizing a monitoring element selected-thereof such that lumped heat transfer analysis is applicable thereto. During the curing process of a material, the heat flux meter calculates the instantaneous convection film coefficient for a particular location and determines the total present heat flux to an object.

Source: Google Patents

35 USC §181 Secrecy Order

Imposed

Sep 10, 1985

Rescinded

Apr 23, 1986

Duration

7 months

Inventor

  • 1MATT D PURSLEY

Sensitive facility: Burbank CA (Lockheed)

Back to patent indexSource: USPTO 35 USC §181 secrecy order records